Advanced Signal Integrity for High-Speed Digital Designs

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Edition: 1st
Format: Hardcover
Pub. Date: 2009-03-16
Publisher(s): Wiley-IEEE Press
List Price: $197.06

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Summary

Signal integrity has become the key issue in most high-performance digital designs. Now, from the foremost experts in the field, this book leverages theory and techniques from non-related fields such as applied physics, communications, and microwave engineering and applies them to the field of high-speed digital design. This approach creates an optimal combination of theory and practice that is meaningful to practicing engineers and graduate students alike.

Author Biography

STEPHEN H. HALL is a Senior Staff Engineer at Intel Corporation, where he leads a team focused on the research of new modeling and measurement solutions for channel speeds as high as 30Gb/sec. Previously at Intel, he was the lead designer for desktop and server buses on Pentium® II, III, and IV based systems, coordinated research in the area of high-speed signaling with multiple universities, led research and development teams in the area of high-speed modeling, and taught signal integrity courses to engineers in two countries. He is also the author of High-Speed Digital System Design (Wiley).

HOWARD L. HECK is a Principal Engineer at Intel Corporation, where he leads development of the signaling specifications and solutions for USB 3.0. He also teaches high-speed digital interconnect design at the Oregon Graduate Institute, is a Senior Member of the IEEE, and holds five patents in the area of high-performance packaging and interconnects, with five more pending.

Table of Contents

Prefacep. xv
Introduction: The Importance of Signal Integrityp. 1
Computing Power: Past and Futurep. 1
The Problemp. 4
The Basicsp. 5
A New Realm of Bus Designp. 7
Scope of the Bookp. 7
Summaryp. 8
Referencesp. 8
Electromagnetic Fundamentals for Signal Integrityp. 9
Maxwell's Equationsp. 10
Common Vector Operatorsp. 13
Vectorp. 13
Dot Productp. 13
Cross Productp. 14
Vector and Scalar Fieldsp. 15
Fluxp. 15
Gradientp. 18
Divergencep. 18
Curlp. 20
Wave Propagationp. 23
Wave Equationp. 23
Relation Between E and H and the Transverse Electromagnetic Modep. 25
Time-Harmonic Fieldsp. 27
Propagation of Time-Harmonic Plane Wavesp. 28
Electrostaticsp. 32
Electrostatic Scalar Potential in Terms of an Electric Fieldp. 36
Energy in an Electric Fieldp. 37
Capacitancep. 40
Energy Stored in a Capacitorp. 41
Magnetostaticsp. 42
Magnetic Vector Potentialp. 46
Inductancep. 48
Energy in a Magnetic Fieldp. 51
Power Flow and the Poynting Vectorp. 53
Time-Averaged Valuesp. 56
Reflections of Electromagnetic Wavesp. 57
Plane Wave Incident on a Perfect Conductorp. 57
Plane Wave Incident on a Lossless Dielectricp. 60
Referencesp. 62
Problemsp. 62
Ideal Transmission-Line Fundamentalsp. 65
Transmission-Line Structuresp. 66
Wave Propagation on Loss-Free Transmission Linesp. 67
Electric and Magnetic Fields on a Transmission Linep. 68
Telegrapher's Equationsp. 73
Equivalent Circuit for the Loss-Free Casep. 76
Wave Equation in Terms of LCp. 80
Transmission-Line Propertiesp. 82
Transmission-Line Phase Velocityp. 82
Transmission-Line Characteristic Impedancep. 82
Effective Dielectric Permittivityp. 83
Simple Formulas for Calculating the Characteristic Impedancep. 85
Validity of the TEM Approximationp. 86
Transmission-Line Parameters for the Loss-Free Casep. 90
Laplace and Poisson Equationsp. 91
Transmission-Line Parameters for a Coaxial Linep. 91
Transmission-Line Parameters for a Microstripp. 94
Charge Distribution Near a Conductor Edgep. 100
Charge Distribution and Transmission-Line Parametersp. 104
Field Mappingp. 107
Transmission-Line Reflectionsp. 113
Transmission-Line Reflection and Transmission Coefficientp. 113
Launching an Initial Wavep. 116
Multiple Reflectionsp. 116
Lattice Diagrams and Over- or Underdriven Transmission Linesp. 118
Lattice Diagrams for Nonideal Topologiesp. 121
Effect of Rise and Fall Times on Reflectionsp. 129
Reflections from Reactive Loadsp. 129
Time-Domain Reflectometryp. 134
Measuring the Characteristic Impedance and Delay of a Transmission Linep. 134
Measuring Inductance and Capacitance of Reactive Structuresp. 137
Understanding the TDR Profilep. 140
Referencesp. 140
Problemsp. 141
Crosstalkp. 145
Mutual Inductance and Capacitancep. 146
Mutual Inductancep. 147
Mutual Capacitancep. 149
Field Solversp. 152
Coupled Wave Equationsp. 153
Wave Equation Revisitedp. 153
Coupled Wave Equationsp. 155
Coupled Line Analysisp. 157
Impedance and Velocityp. 157
Coupled Noisep. 165
Modal Analysisp. 177
Modal Decompositionp. 178
Modal Impedance and Velocityp. 180
Reconstructing the Signalp. 180
Modal Analysisp. 181
Modal Analysis of Lossy Linesp. 192
Crosstalk Minimizationp. 193
Summaryp. 194
Referencesp. 195
Problemsp. 195
Nonideal Conductor Modelsp. 201
Signals Propagating in Unbounded Conductive Mediap. 202
Propagation Constant for Conductive Mediap. 202
Skin Depthp. 204
Classic Conductor Model for Transmission Linesp. 205
Dc Losses in Conductorsp. 206
Frequency-Dependent Resistance in Conductorsp. 207
Frequency-Dependent Inductancep. 213
Power Loss in a Smooth Conductorp. 218
Surface Roughnessp. 222
Hammerstad Modelp. 223
Hemispherical Modelp. 228
Huray Modelp. 237
Conclusionsp. 243
Transmission-Line Parameters for Nonideal Conductorsp. 244
Equivalent Circuit, Impedance, and Propagation Constantp. 244
Telegrapher's Equations for a Real Conductor and a Perfect Dielectricp. 246
Referencesp. 247
Problemsp. 247
Electrical Properties of Dielectricsp. 249
Polarization of Dielectricsp. 250
Electronic Polarizationp. 250
Orientational (Dipole) Polarizationp. 253
Ionic (Molecular) Polarizationp. 253
Relative Permittivityp. 254
Classification of Dielectric Materialsp. 256
Frequency-Dependent Dielectric Behaviorp. 256
Dc Dielectric Lossesp. 257
Frequency-Dependent Dielectric Model: Single Polep. 257
Anomalous Dispersionp. 261
Frequency-Dependent Dielectric Model: Multipolep. 262
Infinite-Pole Modelp. 266
Properties of a Physical Dielectric Modelp. 269
Relationship Between e' and e"p. 269
Mathematical Limitsp. 271
Fiber-Weave Effectp. 274
Physical Structure of an FR4 Dielectric and Dielectric Constant Variationp. 275
Mitigationp. 276
Modeling the Fiber-Weave Effectp. 277
Environmental Variation in Dielectric Behaviorp. 279
Environmental Effects on Transmission-Line Performancep. 281
Mitigationp. 283
Modeling the Effect of Relative Humidity on an FR4 Dielectricp. 284
Transmission-Line Parameters for Lossy Dielectrics and Realistic Conductorsp. 285
Equivalent Circuit, Impedance, and Propagation Constantp. 285
Telegrapher's Equations for Realistic Conductors and Lossy Dielectricsp. 291
Referencesp. 292
Problemsp. 292
Differential Signalingp. 297
Removal of Common-Mode Noisep. 299
Differential Crosstalkp. 300
Virtual Reference Planep. 302
Propagation of Modal Voltagesp. 303
Common Terminologyp. 304
Drawbacks of Differential Signalingp. 305
Mode Conversionp. 305
Fiber-Weave Effectp. 310
Referencep. 313
Problemsp. 313
Mathematical Requirements for Physical Channelsp. 315
Frequency-Domain Effects in Time-Domain Simulationsp. 316
Linear and Time Invariancep. 316
Time- and Frequency-Domain Equivalenciesp. 317
Frequency Spectrum of a Digital Pulsep. 321
System Responsep. 324
Single-Bit (Pulse) Responsep. 327
Requirements for a Physical Channelp. 331
Causalityp. 331
Passivityp. 340
Stabilityp. 343
Referencesp. 345
Problemsp. 345
Network Analysis for Digital Engineersp. 347
High-Frequency Voltage and Current Wavesp. 349
Input Reflection into a Terminated Networkp. 349
Input Impedancep. 353
Network Theoryp. 354
Impedance Matrixp. 355
Scattering Matrixp. 358
ABCD Parametersp. 382
Cascading S-Parametersp. 390
Calibration and Deembeddingp. 395
Changing the Reference Impedancep. 399
Multimode S-Parametersp. 400
Properties of Physical S-Parametersp. 406
Passivityp. 406
Realityp. 408
Causalityp. 408
Subjective Examination of S-Parametersp. 410
Referencesp. 413
Problemsp. 413
Topics in High-Speed Channel Modelingp. 417
Creating a Physical Transmission-Line Modelp. 418
Tabular Approachp. 418
Generating a Tabular Dielectric Modelp. 419
Generating a Tabular Conductor Modelp. 420
NonIdeal Return Pathsp. 422
Path of Least Impedancep. 422
Transmission Line Routed Over a Gap in the Reference Planep. 423
Summaryp. 434
Viasp. 434
Via Resonancep. 434
Plane Radiation Lossesp. 437
Parallel-Plate Waveguidep. 439
Referencesp. 441
Problemsp. 442
I/O Circuits and Modelsp. 443
I/O Design Considerationsp. 444
Push-Pull Transmittersp. 446
Operationp. 446
Linear Modelsp. 448
Nonlinear Modelsp. 453
Advanced Design Considerationsp. 455
CMOS receiversp. 459
Operationp. 459
Modelingp. 460
Advanced Design Considerationsp. 460
ESD Protection Circuitsp. 460
Operationp. 461
Modelingp. 461
Advanced Design Considerationsp. 463
On-Chip Terminationp. 463
Operationp. 463
Modelingp. 463
Advanced Design Considerationsp. 464
Bergeron Diagramsp. 465
Theory and Methodp. 470
Limitationsp. 474
Open-Drain Transmittersp. 474
Operationp. 474
Modelingp. 476
Advanced Design Considerationsp. 476
Differential Current-Mode Transmittersp. 479
Operationp. 479
Modelingp. 480
Advanced Design Considerationsp. 480
Low-Swing and Differential Receiversp. 481
Operationp. 481
Modelingp. 482
Advanced Design Considerationsp. 483
IBIS Modelsp. 483
Model Structure and Development Processp. 483
Generating Model Datap. 485
Differential I/O Modelsp. 488
Example of an IBIS Filep. 490
Summaryp. 492
Referencesp. 492
Problemsp. 494
Equalizationp. 499
Analysis and Design Backgroundp. 500
Maximum Data Transfer Capacityp. 500
Linear Time-Invariant Systemsp. 502
Ideal Versus Practical Interconnectsp. 506
Equalization Overviewp. 511
Continuous-Time Linear Equalizersp. 513
Passive CTLEsp. 514
Active CTLEsp. 521
Discrete Linear Equalizersp. 522
Transmitter Equalizationp. 525
Coefficient Selectionp. 530
Receiver Equalizationp. 535
Nonidealities in DLEsp. 536
Adaptive Equalizationp. 536
Decision Feedback Equalizationp. 540
Summaryp. 542
Referencesp. 545
Problemsp. 546
Modeling and Budgeting of Timing Jitter and Noisep. 549
Eye Diagramp. 550
Bit Error Ratep. 552
Worst-Case Analysisp. 552
Bit Error Rate Analysisp. 555
Jitter Sources and Budgetsp. 560
Jitter Types and Sourcesp. 561
System Jitter Budgetsp. 568
Noise Sources and Budgetsp. 572
Noise Sourcesp. 572
Noise Budgetsp. 579
Peak Distortion Analysis Methodsp. 583
Superposition and the Pulse Responsep. 583
Worst-Case Bit Patterns and Data Eyesp. 585
Peak Distortion Analysis Including Crosstalkp. 594
Limitationsp. 598
Summaryp. 599
Referencesp. 599
Problemsp. 600
System Analysis Using Response Surface Modelingp. 605
Model Design Considerationsp. 606
Case Study: 10-Gb/s Differential PCB Interfacep. 607
RSM Construction by Least Squares Fittingp. 607
Measures of Fitp. 615
Residualsp. 615
Fit Coefficientsp. 616
Significance Testingp. 618
Model Significance: The F-Testp. 618
Parameter Significance: Individual t-Testsp. 619
Confidence Intervalsp. 621
Sensitivity Analysis and Design Optimizationp. 623
Defect Rate Prediction Using Monte Carlo Simulationp. 628
Additional RSM Considerationsp. 633
Summaryp. 633
Referencesp. 634
Problemsp. 635
Useful Formulas, Identities, Units, and Constantsp. 637
Four-Port Conversions Between T- and S-Parametersp. 641
Critical Values of the F-Statisticp. 645
Critical Values of the T-Statisticp. 647
Causal Relationship Between Skin Effect Resistance and Internal Inductance for Rough Conductorsp. 649
Spice Level 3 Model for 0.25 mm MOSIS Processp. 653
Indexp. 655
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