Handbook of X-ray Spectrometry
by Van Grieken, Rene; Markowicz, A.Edition: 2nd
Pub. Date: 2001-11-27
Publisher(s): Taylor & Francis
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Summary
Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum.
Table of Contents
| X-ray physics | |
| Wavelength-dispersive X-ray fluorescence | |
| Energy-dispersive x-ray flourescences | |
| Data analysis | |
| Quantification in XRF analysis of infinitely thick samples | |
| Quantification in XRF analysis of intermediate-thickness samples | |
| Radioisotope X-ray analysis | |
| Synchrotron radiation X-ray emission | |
| Total-reflection XRF | |
| Polarized beam XRF | |
| Capillary beam XRF or X-ray micro-flourescence | |
| Particle-induced X-ray emission | |
| Electron-induced X-ray emission | |
| Sample preparation for XRF | |
| Table of Contents provided by Publisher. All Rights Reserved. |
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